Artifact Details

Title

Downing patent notebook (#732)

Catalog Number

102723914

Type

Document

Description

Describes processing steps to be performed on experimental wafer runs together with expected outcomes and records of actual results. Includes tests for resistance to radiation also platinum and gold (See TR443 and 485 below) doping experiments. Later pages show weekly schedules of task to be performed.

Date

1968-02-16-1971-01-11

Author

Downing, James Philip

Biographical Notes

James (Phil) Downing holds a B.S. (1965) and a Ph.D. (1968) in Electrical Engineering & Computer Sciences from U.C. Berkeley. He joined Fairchild in 1968 where he served in the Surface Physics section managed by E. Snow. He worked at Computer Microtechnology Inc. (CMI) before joining Advanced Micro Devices (AMD) in 1974 as process engineering manager. He served as Managing director of the Bipolar Microprocessor business unit for several years. He left AMD in 1989 to work for Zilog and later at National Semiconductor.

Publisher

Fairchild Semiconductor

Identifying Numbers

Document number 732

Extent

60 dated entries over 107 pages.

Dimensions

12 x 10 inches

Patents

The author is named as inventor on no patents assigned to Fairchild.

Category

Notebooks

Collection Title

Fairchild Semiconductor notebooks and technical papers

Publications

The author contributed to the following R&D Technical Reports (TR) and papers in professional publications during his service at Fairchild:

TR403 Temperature dependence of hFF – effects of space charge recombination (1969-04-25).

TR443 A preliminary study of the technology for gold doping of silicon devices (1969-11-28).

TR485 Impurity energy levels for platinum in silicon (1970-10-30).

Whittier, R. J. and Downing, J. P., Simple physical model for the injection efficiency of diffused pn-junctions . 1968 International Electron Devices Meeting, vol. 14 (1968): 72.

Credit

Gift of Texas Instruments Incorporated

Lot Number

X6464.2012