Explore Collections Search the Collection Fellow Awards Core Magazine Special Projects

Details

Catalog Number

102723967

Title

Plough patent notebook (#380)

Type

Text

Date

1964-08-05-1971-06-04

Author

Plough, Charles T., Jr.

Biographical Notes

Charles T. Plough Jr. of Brooklyn, New York, graduated from Amherst College in Amherst, Massachusetts in the class of 1924. He also attended the University of California, Berkeley. He ran the Fairchild R&D pilot line that was responsible for fabricating wafer runs of prototype transistors and ICs in the early 1960s. In 1966 he was listed on the R&D Professional Staff organizational chart as head of the Technology Development section of the Device Development department reporting to W. Steffe. In the 1980s he is named as inventor on a number of Nichrome resistor patents assigned to Dale Electronics of Columbus, Nebraska.

Publisher

Fairchild Semiconductor

Identifying Numbers

Document number 380

Extent

Approximately 103 dated entries over 112 pages.

Dimensions

12 x 10 inches

Description

This volume contains notes on problems and possible solutions of yield and reliability issues found on wafer runs produced in the R&D pilot line managed by the author and their interactions with various packaging materials. Device types include diode material from the San Rafael plant (pp. 1-15); Schottky diode (p. 18); ADAM diode (p. 22); MOST transistors (p. 24); 64-bit Integrated Memory MOST (IMM) (p. 27 & 40); N-MOST for TV applications (p. 39); FET structures (pp. 80-83). Two ideas for improved structures discussed with W. Kohler are noted on page 109. Loose copies of correspondence with the patent department on the topic are inserted into the pages.

Patents

The author is named as inventor on 4 U.S patents. None were assigned to Fairchild.

Category

Notebooks

Collection Title

Fairchild Semiconductor notebooks and technical papers

Publications

The author contributed to the following R&D Technical Reports (TR) and DoD report during his service at Fairchild:

TR384 High reliability aluminum wire bonding (1969-03-19).

TR488 Aluminum wire bonding (1970-10-26).

Plough, Charles T., Jr., Vashel, George, Kelley, James W., Borowski, Robert T. and Floyd, Daniel W. Development of manufacturing methods for field-effect devices. Defense Technical Information Center (1966-11): Accession Number: AD0804397.

Credit

Gift of Texas Instruments Incorporated

Lot Number

X6464.2012