This interview of Dr. Edward B. Eichelberger has been conducted by Dr. Sumit DasGupta, both of whom worked at IBM. Edward B. Eichelberger received his BS in electrical engineering from Lehigh University in 1956, after which he joined IBM. In 1959, he began his graduate study at Princeton University under the IBM Resident Graduate Study Program. While at Princeton, he worked in the field of switching theory and received his MA and PhD degrees in electrical engineering in 1963. Dr. Eichelberger retired from IBM as an IBM Fellow, a position of rare esteem and is awarded in recognition of sustained outstanding contributions to IBM and the industry at large. Dr. Eichelberger has been awarded multiple awards at IBM, including an Outstanding Contribution Award for Level Sensitive Scan Design (LSSD) and an Outstanding Innovation Award for the development of Weighted Random Pattern Testing at IBM. Dr. Eichelberger was also appointed an IEEE Fellow in 1986 and was awarded the IEEE Computer Society’s W. Wallace McDowell Award with Dr. Tom Williams in 1989.
This interview chronicles some of the major achievements of Dr. Eichelberger that in many ways changed the way computers are designed, starting with ways to do asynchronous sequential circuit design, to LSSD to ensure high testability, to the design of the first microprocessor that used LSSD. Scan design, as a means of designing testable chips and packages, is now no longer limited to IBM but has become ubiquitous throughout the semiconductor industry.
semiconductor history; Level Sensitive Scan Design (LSSD); Latshaw, Lowell; Resident Study Program (RSP); Weighted Random Pattern Testing; McCluskey, Edward J.; Quine-McCluskey