Artifact Details


Greene patent notebook (#454)

Catalog Number





Describes testing of devices for use in ferrite core memory systems. Evaluation of core output vs. drive, detector circuits, and core switching inductance. Compares core vs. thin-film vs. semiconductor technologies for storage. A demonstration system for bipolar 256-bit IC memory chips (possibly a predecessor to the Illiac IV project) and a proposed bipolar memory cell design (p. 142). .




Greene, Frank S., Jr.

Biographical Notes

Frank S. Greene attended Washington University in St. Louis where he obtained a B.S.E.E. He earned an M.S. in electrical engineering at Purdue University and a Ph.D. at Santa Clara University in 1970. He joined the Fairchild Memory Products Division as a junior engineer in Harley Perkins’ Ferrite Core Memory Group in 1965. By 1968 this activity was closed and Greene worked in a Flat-Wire Memory section managed by C. Bittmann in the Physics Department. In 1970-71 he worked with Wendell Sander on the Illiac IV semiconductor memory system project. In the early1970s, he co-founded software and computer service companies Technology Development Corp. and ZeroOne Systems Inc. Greene was among the first black students to attend college at Washington University and an early African-American engineer in Silicon Valley. He founded NewVista Capital, a venture capital firm with a special focus on minority and female-headed firms.


Fairchild Semiconductor

Identifying Numbers

Document number 454


Approximately 56 dated entries over 146 pages.


12 x 10 inches


The author is named as inventor on 1 U.S patent. This patent was assigned to Fairchild:

U.S. patent 3654610, “Use of faulty storage circuits by position coding.” Filed 1970-09-28. Issued 1972-04-04.



Collection Title

Fairchild Semiconductor notebooks and technical papers


The author contributed to the following R&D Technical Reports (TR) and papers in professional publications during his service at Fairchild:

TR 357 Combinatorial decoding of semiconductor memory arrays (1968-09-06).

TR 394 LSI bipolar memory for symbol II (1969-03-20).

Rice, R., Sander, W.B., Jr. and Greene, F.S. Design considerations leading to the ILLIAC IV LSI process element memories. IEEE Journal of Solid-State Circuits, vol. 5, iss. 5 (1970): 174-181.


Gift of Texas Instruments Incorporated

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