This notebook was used to record run process data and electrical test results on Micrologic integrated circuit flip-flop wafers during the development of the successful methyl borate diffusion process for electrical (junction) isolation for wafer runs designated FFI-138 through FFI-184. The entry headed FFI-138, after a page dated 1960-08-27, records the boron diffusion parameters for the first “unit tested good” electrically isolated devices.
Kattner, Lionel E.
Lionel Estes Kattner (1930 – 2011) received a degree in chemistry, physics and math from Southwestern University, located in Georgetown, Texas in 1951. After graduation he worked at the Hanford, Washington plant on the production of plutonium for nuclear weapons and later served as a nuclear officer in the United States Navy. In 1958 he joined Texas Instruments in Dallas as a product engineer on a germanium mesa transistor product line. In 1959 Kattner was recruited into Jay Last’s microelectronics group at Fairchild Semiconductor where he worked closely with I. Haas on the fabrication of Micrologic, the first planar integrated circuit family. With three other Fairchild employees, he co-founded Signetics Corporation in 1961. He resigned from Signetics in 1967 and spent two years at Amelco Semiconductor. From 1969 until his retirement Kattner was involved with various projects and startups, including real estate development, computers, computerized mapping, microwave communications and fiber optics.
Approximately 10 dated entries over 17 pages.
10 x 8 inches
The author is named as inventor on 1 U.S patent. This patent is not assigned to Fairchild.
Fairchild Semiconductor notebooks and technical papers