TitleRoberts patent notebook (# None)
DescriptionThis volume contains experimental results of neutron irradiation of NPN and PNP transistors on current gain (hfe) and change in value when aged up to 100 hours at 100 degrees C. See Roberts (7) (pp. 47-48). Results are recorded in columns on alternate double page spreads.
AuthorRoberts, C. Sheldon
Biographical NotesCornelius Sheldon Roberts was born in 1926 in Rupert, Vermont. He received a B.S. in metallurgical engineering from Rensselaer Polytechnic Institute, located in Troy, New York in 1948 followed by an M.S. in 1949 and a Ph.D. in 1952 from MIT. He conducted metallurgical research at the Naval Research Lab and the Dow Chemical Company and joined the Shockley Semiconductor Laboratory in Mountain View, California, in 1956. With Robert Noyce and others Roberts founded Fairchild Semiconductor Corporation in 1957 where his primary focus was on silicon crystal production. He left with Jay Last to found Amelco Semiconductor, a division of Teledyne Inc. in 1961 where he developed solid-state transducers and an epitaxial silicon wafer program. Later Roberts consulted in materials and processes for the aerospace, electronic materials, metals, and microelectronics industries.
PublisherFairchild Semiconductor Corporation
ExtentApproximately 23 dated entries over 101 pages. Many pages are blank.
Dimensions12 x 10 inches
PatentsThe author is named as inventor on 2 U.S patents. 1 was assigned to Fairchild:
U.S. patent 3013955, “Method of transistor manufacture.” Filed 1959-04-29. Issued 1961-12-19.
Collection TitleFairchild Semiconductor notebooks and technical papers
PublicationsThe author contributed to the following R&D Technical Report (TR), wrote articles for professional journals, and a textbook on magnesium during his service at Fairchild:
TR27 Effect on piezoresistive gage factors of stress transverse to principal substrate strain (1960-10-15).
Roberts, Sheldon., Magnesium and its alloys. John Wiley & Sons, 1960.