Sklar patent notebook (#425)
This volume contains detailed records of process runs managed by the author for Bruce Deal. Material type and processing steps are documented for runs designated BED-416 through BED-827. During this period Deal was working with Andy Grove and Ed Snow investigating the sources of MOS instability and surface state conditions. Several runs (1965-11-01, 1966-02-28, and 1966-03-01) were identified as for “Na analysis.” Technical Reports based on this work that were published during the period covered by this volume include TR211, and TR261. The latter was the first report to unequivocally characterize surface state charge in the Si-SiO2 system, and describe detailed processing approaches to control and minimize this charge and a 1967 conference paper (below) of the same name includes Sklar as an author.
Item Details
- Date
- 1965-02-09-1966-11-07 (Made)
- Type
- Document
- Catalogue number
- 102723035
- Other identifying number
- 425 (Document Number)
- Organization
- Fairchild Semiconductor (Publisher)
- People
- Sklar, Maija (Author)
- Category
- Notebooks
- Credit line
- Gift of Texas Instruments Incorporated
- Extent
- Approximately 195 dated entries over 57 pages.
- Language
- English
- Acquisition number
- X6464.2012
- Archive collection
- Fairchild Semiconductor notebooks and technical papers
- Archive hierarchy
- Fairchild Semiconductor notebooks and technical papers