TitleWandry patent notebook (#472)
DescriptionThis is the first in a series of “Mount Log” books. It provides a continuing record of the author’s work of mounting semiconductor device specimens in preparation for taking optical and SEM photographs for members of the engineering staff. Data recorded includes; mount #, date, description of the specimen and the requesting engineer’s name (the customer). Many of the resulting photographs were mounted in the respective engineer’s notebooks. These records could be used to identify the products and type of analysis being undertaken by the customer engineers during this period.
Biographical NotesWarner Wandry worked at Fairchild form 1964 to 1972. A 1968 R&D organization chart shows him as a Technical Specialist reporting to E. Meieran in the Silicon Materials Section of the Materials and Processes Department managed by Ross Tucker. His notebooks indicate that he was responsible for providing services to the engineering staff, including preparing specimens and photographing wafers, die, and package materials using optical and SEM techniques.
ExtentTypically 40 to 44 per page on approximately 89 filled pages.
Dimensions12 x 10 inches
Collection TitleFairchild Semiconductor notebooks and technical papers
PublicationsThe author contributed to the following R&D Technical Reports (TR) papers during his service at Fairchild:
TR 130 A comparison of etches for dislocations in silicon. Appendix: determination of dislocation density in silicon (1963-07-29).
TR142 Examination and evaluation of Hewlett Packard Associates hot electron diodes (1963-10-08).