Oxygen levels in silicon material, gettering, surface analysis, C-V profile, spreading resistance
Bio-Rad Laboratories. DIGILAB; Siltec Silicon Division; IBM Instruments Inc.
This material originally came from the same binder, which Metz had labeled: "O2 content, gettering info, surface analysis, C-V profile, spreading resistance."
Presentation Material; Technical Paper or Note; Article; Newsletter
Digital Equipment Corporation records
Engineers’ papers: Walter Metz papers
Gift of Hewlett-Packard Company